The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for nonuniform quantization.
- Standard Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
- Status
- Active Standard
- PAR Approval
- 2016-06-30
- Superseding
- 1241-2010
- Board Approval
- 2023-06-05
Working Group Details
- Society
- IEEE Instrumentation and Measurement Society
- Standard Committee
- IM/WM&A - TC10 - Waveform Generation Measurement and Analysis
- Working Group
-
ADC - Working Group for Analog-to-Digital Converters
Learn More About ADC - Working Group for Analog-to-Digital Converters - IEEE Program Manager
- Patrycja Jarosz
Contact Patrycja Jarosz - Working Group Chair
- Steven Tilden
Other Activities From This Working Group
Current projects that have been authorized by the IEEE SA Standards Board to develop a standard.
No Active Projects
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No Active Standards
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
No Superseded Standards
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No Inactive-Withdrawn Standards
These standards are removed from active status through an administrative process for standards that have not undergone a revision process within 10 years.
1241-2010
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
The material presented in this standard is intended to provide common terminology and test methods for the testing and evaluation of analog-to-digital converters (ADCs). This standard considers only those ADCs whose output values have discrete values at discrete times, i.e., they are quantized and sampled. In general, this quantization is assumed to be nominally uniform (the input-output transfer curve is approximately a straight line) as discussed further in 1.3, Analog-to-digital converter background, and the sampling is assumed to be at a nominally uniform rate. Some but not all of the test methods in this standard can be used for ADCs that are designed for non-uniform quantization.