Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifically 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.
- Standard Committee
- PE/IC - Insulated Conductors
- Status
- Active Standard
- PAR Approval
- 2017-09-28
- Superseding
- 592-2007
- Board Approval
- 2018-06-14
- History
-
- Published:
- 2018-06-29
Working Group Details
- Society
- IEEE Power and Energy Society
- Standard Committee
- PE/IC - Insulated Conductors
- Working Group
-
B03W/P592_WG - Exposed Semi-con Test Working Group
Learn More About B03W/P592_WG - Exposed Semi-con Test Working Group - IEEE Program Manager
- Michael Kipness
Contact Michael Kipness - Working Group Chair
- Sherif Kamel
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592-2007
IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors
Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.
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