Tag: Instrumentation and Measurement

IEEE Standard Reliability Program for the Development and Production of Electronic Products

A standard set of reliability program objectives for use between customers and producers, or within product development teams, to express reliability program requirements early in the development phase of electronic…
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IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification

This standard extends IEEE Std 1450-1999 (STIL) to 39 provide an interface between test generation tools and test equipment with regard to the specification of the flow of execution of…
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IEEE Standard for Camera Phone Image Quality

Quantifying the performance of camera-equipped mobile devices is covered in this standard, with an emphasis on metrics and procedures appropriate to the types of sensors, lenses, and signal processing routines…
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IEEE Standard Framework for Prognostics and Health Management of Electronic Systems

Information for the implementation of prognostics and health management (PHM) for electronic systems is described in this standard. A normative framework for classifying PHM capability and for planning the development…
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IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505(TM) Receiver Fixture Interface Standard

Portable/benchtop test equipment applications are supported in this document by defining a mass interconnection scheme and pin configuration based upon IEEE Std 1505(TM)-2010 and IEEE Std 1505.1(TM)-2015. Particular emphasis has…
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IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters

Instrument Description templates, compliant with IEEE Std 1671.2-2012, that providers of synthetic instruments should use to describe waveform generators, digitizers, external local oscillators, and up and down converters are provided…
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IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

This document is a recommended practice to extending the ATML exchange formats to for the purposes describing intrinsic paths. The recommended practice presents an XML schema an ATML instance document,…
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IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits

IEEE Std 1838 is a die-centric standard; it applies to a die that is intended to be part of a multi-die stack. This standard defines die-level features that, when compliant…
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IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and module DACs and…
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